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Updated: Jun 6, 2025

Measurement of Scattering Nonlinearities from a Single Plasmonic Nanoparticle
Published on: January 3, 2016
Deep Learning Assisted Plasmonic Dark-Field Microscopy for Super-Resolution Label-Free Imaging
Ming Lei1, Junxiang Zhao1, Ayse Z Sahan2,3
1Department of Electrical and Computer Engineering, University of California-San Diego, 9500 Gilman Drive, La Jolla, California 92093, United States.
Abstract:
Dark-field microscopy (DFM) is a widely used imaging tool, due to its high-contrast capability in imaging label-free specimens. Traditional DFM requires optical alignment to block the oblique illumination, and the resolution is diffraction-limited to the wavelength scale. In this work, we present deep-learning assisted plasmonic dark-field microscopy (DAPD), which is a single-frame super-resolution method using plasmonic dark-field (PDF) microscopy and deep-learning assisted image reconstruction. Specifically, we fabricated a designed PDF substrate with surface plasmon polaritons (SPPs) illuminating specimens on the substrate. Dark field images formed by scattered light from the specimen are further processed by a pretrained convolutional neural network (CNN) using a simulation dataset based on the designed substrate and parameters of the detection optics. We demonstrated a resolution enhancement of 2.8 times on various label-free objects with a large potential for future improvement. We highlight our technique as a compact alternative to traditional DFM with a significantly enhanced spatial resolution.

