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Multi-wavelength digital holography based on Kramers-Kronig relations
Optics Letters
|December 13, 2024
Summary
This study introduces a new multi-wavelength digital holography method using Kramers-Kronig (KK) relations. It significantly enhances accuracy and resolution in 3D measurements by improving spectral utilization.
Area of Science:
- Optics and Photonics
- Metrology
- Digital Holography
Background:
- Traditional angle-multiplexing techniques in multi-wavelength digital holography face limitations in accuracy and resolution.
- Spectral utilization and measurement accuracy are critical challenges in multi-wavelength interference applications.
Purpose of the Study:
- To develop a unified angle-multiplexing multi-wavelength Kramers-Kronig (KK) model for enhanced digital holography.
- To overcome the accuracy and resolution limitations of existing angle-multiplexing methods.
- To improve spectral utilization and measurement accuracy in multi-wavelength interference.
Main Methods:
- Proposed a multi-wavelength digital holography approach based on Kramers-Kronig (KK) relations.
- Developed a unified angle-multiplexing multi-wavelength KK model.
- Captured object light waves using the full effective bandwidth from a single interferogram and reference wave intensity by linking real and imaginary parts of the multi-wavelength complex function via the KK relation.
- Employed a three-wavelength multiplexing system for topography measurement of multi-step samples.
Main Results:
- Expanded the spectral range by more than twice compared to traditional methods.
- Reduced measurement errors by 39.3%.
- Improved peak signal-to-noise ratio and structural similarity index by nearly three times compared to the Fourier transform (FT) method.
Conclusions:
- The proposed KK-based multi-wavelength digital holography method significantly enhances measurement accuracy and resolution.
- This approach offers a novel solution for high-precision multi-wavelength dynamic measurements.
- The method demonstrates potential to overcome existing limitations in multiplexing technology for optical measurements.

