Photo-Excited Carrier Dynamics in Ammonothermal Mn-Compensated GaN Semiconductor

We investigated the carrier dynamics of ammonothermal Mn-compensated gallium nitride (GaN:Mn) semiconductors by using sub-bandgap and above-bandgap photo-excitation in a photoluminescence analysis and pump-probe measurements. The contactless probing methods elucidated their versatility for the complex analysis of defects in GaN:Mn crystals. The impurities of Mn were found to show photoconductivity and absorption bands starting at the 700 nm wavelength threshold and a broad peak located at 800 nm. Here, we determined the impact of Mn-induced states and Mg acceptors on the relaxation rates of charge carriers in GaN:Mn based on a photoluminescence analysis and pump-probe measurements. The electrons in the conduction band tails were found to be responsible for both the photoconductivity and yellow luminescence decays. The slower red luminescence and pump-probe decays were dominated by Mg acceptors. After photo-excitation, the electrons and holes were quickly thermalized to the conduction band tails and Mg acceptors, respectively. The yellow photoluminescence decays exhibited a 1 ns decay time at low laser excitations, whereas, at the highest ones, it increased up to 7 ns due to the saturation of the nonradiative defects, resembling the photoconductivity lifetime dependence. The fast photo-carrier decay time observed in ammonothermal GaN:Mn is of critical importance in high-frequency and high-voltage device applications.