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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Li Zhan1, Xudong Pei1, Jiachen Tang1
1School of Electronic Science and Engineering, College of Engineering and Applied Sciences, National Laboratory of Solid-State Microstructures, and Collaborative Innovation Center of Advanced Microstructure, Nanjing University, Nanjing, 210023, China.
Highly oriented tungsten disulfide (WS2) monolayers were synthesized for advanced electronics. This breakthrough in 2D semiconductor materials offers high performance for future microelectronic applications.
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