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Updated: Jun 3, 2025

A Standard and Reliable Method to Fabricate Two-Dimensional Nanoelectronics
Published on: August 28, 2018
Ultrahigh carrier mobility and multidirectional piezoelectricity in 2D Janus copper-containing chalcogenide
Mengbing Liu1, Xingxu Meng1, Yuli Yan1
1Institute for Computational Materials Science, Joint Center for Theoretical Physics, and Key Laboratory for High Efficiency Energy Conversion Science and Technology of Henan Province, School of Physics and Electronics, Henan University, Kaifeng 475004, China. yhb@henu.edu.cn.
Abstract:
Two-dimensional (2D) materials have attracted enormous research attention due to their remarkable properties and potential applications in electronic and optoelectronic devices. In this work, Janus 2D copper-containing chalcogenides, CuP2Se0.5S0.5 and CuP2Te0.5Se0.5 monolayers, are proposed and studied systematically based on first-principles calculations. These two Janus-structured materials possess the same thermal and dynamic stability as the perfect CuP2Se structure. Remarkably, we observe multiple VBM and CBM points with negligible energy differences in the band structures of perfect CuP2Se and Janus CuP2Se0.5S0.5 and CuP2Te0.5Se0.5 monolayers. This will significantly impact the electronic and transport properties of the material. The calculated anisotropic carrier mobilities can reach 104-105 cm2 V-1 s-1 orders of magnitude, which are higher than those of most reported materials. Meanwhile, the two Janus derivatives, CuP2Se0.5S0.5 and CuP2Te0.5Se0.5 monolayers, exhibit outstanding multidirectional piezoelectricity, which are comparable with those of traditional piezoelectric materials. The combination of ultrahigh carrier mobility and multidirectional piezoelectricity indicates that these novel 2D Janus materials could be promising for applications in electronic and piezoelectric devices under special conditions.
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