HfO2-based ferroelectric synaptic devices: challenges and engineering solutions.

Taegyu Kwon1, Hyeong Seok Choi1, Dong Hyun Lee1

  • 1Department of Materials Science and Engineering & Inter-University Semiconductor Research Center, College of Engineering, Seoul National University, Seoul 08826, Republic of Korea. minhyuk.park@snu.ac.kr.

Chemical Communications (Cambridge, England)
|January 24, 2025
PubMed
Summary

Hafnium oxide (HfO2)-based ferroelectric memories show promise as artificial synapses. This review explores material properties, challenges, and engineering strategies for enhanced synaptic performance in HfO2 ferroelectric synaptic devices.

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