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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

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Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
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Overview of Microscopy Techniques01:22

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The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
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Atomic Fluorescence Spectroscopy01:29

Atomic Fluorescence Spectroscopy

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Atomic fluorescence spectroscopy (AFS) is an analytical technique that involves the electronic transitions of atoms in a flame, furnace, or plasma being excited by electromagnetic (EM) radiation. When these atoms absorb energy, they become excited and subsequently release energy as they return to their original state. This emitted light, or "fluorescence," is observed at a right angle to the incident beam. Both absorption and emission processes transpire at distinct wavelengths, which...
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Related Experiment Video

Updated: May 30, 2025

Atomic Force Microscopy Imaging and Force Spectroscopy of Supported Lipid Bilayers
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Atomic Force Microscopy Imaging and Force Spectroscopy of Supported Lipid Bilayers

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Advanced atomic force microscopy techniques V

Philipp Rahe1, Ilko Bald2, Nadine Hauptmann3

  • 1Institut für Physik, Universität Osnabrück, Barbarastraße 7, 49076 Osnabrück, Germany.

Beilstein Journal of Nanotechnology
|January 29, 2025
PubMed
Summary

No abstract available in PubMed .

Keywords:
AFMNC-AFMatomic force microscopyconductivitydrift correctionforce spectroscopynon-contact atomic force microscopyresistivitytip–surface interaction

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