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Updated: May 30, 2025

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Atomic Force Microscopy Imaging and Force Spectroscopy of Supported Lipid Bilayers
Published on: July 22, 2015
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Advanced atomic force microscopy techniques V
Philipp Rahe1, Ilko Bald2, Nadine Hauptmann3
1Institut für Physik, Universität Osnabrück, Barbarastraße 7, 49076 Osnabrück, Germany.
Beilstein Journal of Nanotechnology
|January 29, 2025
Abstract
No abstract available in PubMed .
Keywords:
AFMNC-AFMatomic force microscopyconductivitydrift correctionforce spectroscopynon-contact atomic force microscopyresistivitytip–surface interactionMore Related Videos
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