Biasing of FET
MOSFET: Enhancement Mode
Field Effect Transistor
Biasing of Metal-Semiconductor Junctions
MOSFET: Depletion Mode
MOSFET
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Updated: May 29, 2025

In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx
Published on: May 13, 2020
Daniele Nazzari1, Lukas Wind1, Masiar Sistani1
1Institute of Solid State Electronics, Technische Universität Wien, Gußhausstraße 25-25a, 1040 Vienna, Austria.
New reconfigurable field-effect transistors (RFETs) integrated with ferroelectric hafnium zirconium oxide (HZO) enable logic-in-memory (LiM) hardware. This innovation supports low-power artificial neural network (ANN) execution with embedded self-learning capabilities.
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