Controllable Growth of Wafer-Scale Te1-xSex Thin Films Based on Selenium Phase Change-Induced Strategy for
Xuemei Lu1, Yulong Hao2, Shijie Hao1
1School of Physics and Optoelectronics and Hunan Institute of Advanced Sensing and Information Technology, Xiangtan University, Xiangtan, 411105, P. R. China.
Researchers developed a new method for creating large-area tellurium-selenium (Te1-xSex) films for infrared detection. This technique enables precise composition control and high-performance imaging applications.
Area of Science:
- Materials Science
- Thin Film Deposition
- Semiconductor Physics
Background:
- Tellurium-selenium (Te1-xSex) films show promise for infrared detection.
- Conventional deposition methods yield poorly crystallized films and face challenges in large-area synthesis.
Purpose of the Study:
- To develop a controlled synthesis method for large-area Te1-xSex films.
- To investigate the mechanism of Te1-xSex alloy formation.
- To demonstrate the performance of Te1-xSex films in infrared imaging.
Main Methods:
- Low-pressure chemical vapor deposition (LPCVD) using a selenium phase transition-induced strategy.
- Precise control of film composition by adjusting Te and Se powder ratios.
- COMSOL simulations to analyze growth uniformity.
Main Results:
- Successfully fabricated two-inch wafer-scale Te1-xSex films with controllable compositions (x from 0 to 1).
- Demonstrated that amorphous selenium phase transition facilitates Te incorporation into Se chains.
- Achieved high-performance near-infrared single-pixel imaging (128x128 pixels) using a Te0.4Se0.6 film detector.
Conclusions:
- The developed LPCVD method enables controlled synthesis of wafer-scale Te1-xSex alloy thin films.
- These films exhibit excellent properties for infrared detection and imaging.
- The findings provide crucial support for Te1-xSex applications in electronics, photonics, and optoelectronics.
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