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Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
Thomas W Radford1, Peter R Wiecha2, Alberto Politi1
1School of Physics and Astronomy, University of Southampton, Southampton, SO17 1BJ, United Kingdom.
We developed a new method using neural networks to design integrated optical devices. This platform enables programmable unitary operations for applications like quantum computing and optical neural networks.
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