Development of an innovative low-temperature PEALD process for stress-compensated TiO2 and SiO2 multilayer

Duy Thanh Cu1, Kuan-Yu Ko1, Wen-Hao Cho2

  • 1Department of Optics and Photonics/Thin Film Technology Center, National Central University, 300, Chung Da Rd, Chung Li, Taoyuan, 32001, Taiwan.

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|March 25, 2025
PubMed

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