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Updated: May 20, 2025

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
Q Le Thien1,2, R Pynn1, G Ortiz1,2,3
1Indiana University, Department of Physics, Bloomington, Indiana 47405, USA.
We developed entangled-beam reflectometry to analyze material surfaces. This technique uses entangled probes to reveal spatial structures, including magnetic properties, with high precision.
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