An Alloyed a-Se-Te Indirect Flat Panel Imager for Improved Performance in a Dual-Layer X-ray Detector

Kaitlin Hellier1, Kellii Fusari1,2, Paul Pryor3

  • 1Electrical and Computer Engineering, University of California, Santa Cruz, 1156 High St., Santa Cruz, CA, USA, 95064.

Summary

Researchers improved dual-layer X-ray detectors by alloying amorphous selenium (a-Se) with tellurium (Te). This enhances conversion efficiency by over 30%, paving the way for better lesion differentiation in medical imaging.