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A novel approach for detecting negative charge accumulation induced by electron beam irradiation using power MOSFET

Xianghe Fu1, Yahui Cai2, Wenjie Feng1

  • 1School of Microelectronics, Faculty of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an 710049, China.

The Review of Scientific Instruments
|April 17, 2025
PubMed

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