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Published on: April 18, 2013
CMOS-Based Implantable Multi-Ion Image Sensor for Mg2+ Measurement in the Brain
Yuto Nakamura1, Hideo Doi1, Yasuyuki Kimura1
1Department of Electrical and Electronic Information Engineering, Toyohashi University of Technology, Toyohashi 441-8122, Aichi, Japan.
Abstract:
An implantable multi-ion image sensor equipped with magnesium ion (Mg2+)-and calcium ion (Ca2+)-sensitive membranes was fabricated for the selective measurement of extracellular Mg2+ in the brain, and the sensor performance was evaluated. This sensor complements the low selectivity of the Mg2+-sensitive membrane for Ca2+ by depositing a Ca2+-sensitive membrane in addition to the Mg2+-sensitive membrane on a CMOS (Complementary Metal Oxide Semiconductor)-based potentiometric sensor array with 5.65 × 4.39 µm2 pitch, enabling selective measurement of Mg2+ and Ca2+. Characterization of the sensor confirmed a Ca2+ sensitivity of 26.5 mV/dec and Mg2+ sensitivity of 19 mV/dec. Based on validation experiments with varying concentrations of Mg2+ and Ca2+, selective Ca2+ and Mg2+ measurements were successfully achieved. Furthermore, real-time imaging of Mg2+ and Ca2+ and quantification of their concentration changes were performed. The developed sensor may be successfully applied for extracellular multi-ion imaging of Mg2+ and Ca2+ in the living brain.

