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Updated: May 23, 2025

In Situ SIMS and IR Spectroscopy of Well-defined Surfaces Prepared by Soft Landing of Mass-selected Ions
Published on: June 16, 2014
Low temperature deposition of functional thin films on insulating substrates enabled by selective ion acceleration
Jyotish Patidar1, Oleksandr Pshyk1, Kerstin Thorwarth1
1Empa, Swiss Federal Laboratories for Materials Science and Technology, Dübendorf, Switzerland.
Abstract:
Ionized physical vapor deposition techniques, such as high-power impulse magnetron sputtering (HiPIMS), are gaining popularity but face challenges for deposition on insulating materials, where applying negative potentials for ion acceleration is difficult. While radio frequency biasing works on insulators, it risks film damage from energetic process gas ions. Here, we present Synchronized Floating Potential HiPIMS (SFP-HiPIMS), which exploits the substrate's transient negative floating potential during HiPIMS discharges. By timing the ion arrival with this negative potential, selective metal-ion acceleration can be achieved, improving adatom mobility while minimizing energetic Ar+ bombardment. As proof-of-concept, we deposit Al0.88Sc0.12N thin films on various insulating substrates. SFP-HiPIMS improves the films' crystallinity, texture and residual stress, and also enables epitaxial growth on c-cut sapphire at temperatures as low as 100 °C. SFP-HiPIMS provides a solution for a long-standing challenge in physical vapor deposition, which works for many different materials and integrates readily with standard deposition equipment.

