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Transmission Electron Microscopy

Transmission Electron Microscopy

In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400...

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Related Experiment Video

Updated: Jun 16, 2025

High-resolution Thermal Micro-imaging Using Europium Chelate Luminescent Coatings

High-resolution Thermal Micro-imaging Using Europium Chelate Luminescent Coatings

Published on: April 16, 2017

Secondary electron emission current mapping for nanoscale thermometry.

William Hubbard¹, Matthew Mecklenburg², Ho Leung Chan^2,3

¹NanoElectronic Imaging, Riverside, CA 92506, United States of America.

|June 13, 2025

Summary

This summary is machine-generated.

Secondary electron (SE) emission thermometry uses electron microscopy to map temperature at the nanoscale. This technique, utilizing SE emission from heated materials, shows promise for widespread application in transmission electron microscopy (TEM).

Keywords:

STEM EBIC TEM high-resolution thermometry

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Last Updated: Jun 16, 2025

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Area of Science:

Materials Science
Nanotechnology
Electron Microscopy

Background:

Secondary electron (SE) emission is sensitive to temperature.
Electron microscopy offers nanoscale spatial resolution.
Developing nanoscale thermometry techniques is crucial for materials characterization.

Purpose of the Study:

To investigate the potential of secondary electron (SE) emission as a basis for electron microscopy-based thermometry.
To develop a nanoscale spatial resolution thermometry technique using scanning transmission electron microscopy (STEM).

Main Methods:

Measurements of SE emission from heated test structures (platinum, amorphous carbon, and aluminum nanoparticles) using STEM.
Utilizing electron beam-induced current (EBIC) imaging.
Employing plasmon energy expansion thermometry (PEET) for local nanothermometer calibration.

Main Results:

SE emission from platinum, carbon, and aluminum was found to be a simple, supralinear function of temperature.
The temperature dependence of SE emission was well-fit with a single free parameter.
Successful demonstration of SEEBIC thermometry for temperature mapping.

Conclusions:

Secondary electron emission thermometry is a promising technique for nanoscale temperature mapping.
The method shows potential for wide applicability in transmission electron microscopy (TEM).
This technique can provide valuable insights into thermal properties of materials at the nanoscale.