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Quantitative Probing of Polarization-Driven Carrier Density Reconfiguration in FeFETs

Shengyao Su1,2,3, Yingli Zhang1,2,3, Chuanlai Ren1,2,3

  • 1Department of Materials Science and Engineering, Southern University of Science and Technology, Shenzhen 518055, Guangdong, China.

Nano Letters
|August 1, 2025
PubMed
Abstract

Keywords:
FeFETsPFMcarrier densitysMIM

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