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Updated: Sep 11, 2025

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
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Uncertainty quantification in diffraction gratings: reliability analysis using a reduced basis method

Rubén Aylwin, José Pinto, Gerardo Silva-Oelker

    Journal of the Optical Society of America. A, Optics, Image Science, and Vision
    |August 12, 2025
    PubMed
    Abstract

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