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Updated: Jan 18, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
X-ray dynamical diffraction wavefront division interferometer (double-slit diffraction) with an asymmetric
Vahram Mkrtchyan1, Minas Balyan1, Sargis Petrosyan1
1Institute of Physics, Yerevan State University, Alex Manoogian 1, Yerevan, 0025, Armenia.
Researchers explored an asymmetric monochromator and X-ray interferometer system. They determined the monochromator asymmetry needed to observe dynamical diffraction Young fringes for advanced X-ray applications.
Area of Science:
- Physics
- Optics
- Crystallography
Background:
- X-ray interferometry is crucial for high-resolution imaging and material analysis.
- Dynamical diffraction phenomena are key to understanding wave interactions within crystals.
- Observing interference fringes in diffracted X-ray beams presents unique challenges.
Purpose of the Study:
- To analyze a system combining an asymmetric monochromator and an X-ray interferometer for wavefront division.
- To determine the specific conditions required for observing interference fringes in the diffracted beam.
- To explore applications in defect detection, crystal deformation analysis, and holographic imaging.
Main Methods:
- Theoretical analysis of incident spherical waves interacting with an asymmetric monochromator.
- Modeling the passage of X-rays through a double-slit system after reflection.
- Investigating the conditions for interference fringe observation in the diffracted beam using a second crystal.
Main Results:
- A specific requirement for the monochromator asymmetry coefficient was derived.
- Diagrams were developed to predict the observability of interference fringes.
- The study establishes conditions for observing dynamical diffraction Young fringes.
Conclusions:
- The derived monochromator asymmetry coefficient enables the observation of interference fringes.
- The system is suitable for realizing advanced X-ray interferometers and holographic schemes.
- Potential applications include precise defect and deformation field determination in crystals.
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