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Updated: Mar 27, 2026

On-Chip Crystallization and Large-Scale Serial Diffraction at Room Temperature
Published on: March 11, 2022
X-ray dynamical diffraction wavefront division interferometer (double-slit diffraction) with an asymmetric
Vahram Mkrtchyan1, Minas Balyan1, Sargis Petrosyan1
1Institute of Physics, Yerevan State University, Alex Manoogian 1, Yerevan, 0025, Armenia.
This study corrects a previously published error in crystallographic data analysis. The correction ensures the accuracy of scientific findings derived from the article by Mkrtchyan et al.
Area of Science:
- Crystallography
- Materials Science
Background:
- Scientific accuracy is paramount in crystallographic research.
- Previous publications may contain errors that require correction.
Purpose of the Study:
- To address and rectify an identified error in the article by Mkrtchyan et al. published in Acta Cryst. (2025), A81, 438-448.
- To ensure the integrity and reliability of crystallographic data and subsequent research.
Main Methods:
- Detailed re-examination of the original data and analysis presented in the cited article.
- Application of established crystallographic principles and computational tools for verification.
Main Results:
- Identification and quantification of the specific error within the original publication.
- Provision of the corrected data or analysis, superseding the erroneous information.
Conclusions:
- The correction ensures the accuracy of crystallographic information.
- This highlights the importance of rigorous peer review and error correction in scientific literature.
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