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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Related Experiment Video

Updated: Jan 16, 2026

Assessment of Boron Doped Diamond Electrode Quality and Application to In Situ Modification of Local pH by Water Electrolysis

Assessment of Boron Doped Diamond Electrode Quality and Application to In Situ Modification of Local pH by Water Electrolysis

Published on: January 6, 2016

Material Removal on Hydrogen-Terminated Diamond Surface via AFM Tip-Based Local Anodic Oxidation.

Jinyan Tang¹, Zhong-Hao Cao¹, Zhongwei Li¹

¹The State Key Lab of Fluid Power and Mechatronic Systems, Zhejiang University, Hangzhou 310058, China.

|September 27, 2025

Summary

Researchers developed a new method for precise material removal on diamond surfaces using atomic force microscopy (AFM). This technique enhances diamond machinability for future semiconductor applications.

Keywords:

hydrogen-terminated diamond local anodic oxidation semiconductor fabrication

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Last Updated: Jan 16, 2026

Assessment of Boron Doped Diamond Electrode Quality and Application to In Situ Modification of Local pH by Water Electrolysis

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Published on: January 6, 2016

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Covalent Attachment of Single Molecules for AFM-based Force Spectroscopy

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Published on: March 16, 2020

Area of Science:

Materials Science
Nanotechnology
Surface Engineering

Background:

Diamond is a superior semiconductor material compared to silicon due to its wider band gap, higher electron mobility, and thermal conductivity.
The extreme hardness of diamond presents significant challenges for fabrication and integration into devices.

Purpose of the Study:

To demonstrate a novel method for controlled material removal on hydrogen-terminated diamond surfaces.
To investigate the potential of atomic force microscope (AFM) tip-based local anodic oxidation for diamond processing.
To explore methods for improving the machinability of diamond for advanced applications.

Main Methods:

Utilized atomic force microscope (AFM) tip-based local anodic oxidation for material removal.
Precisely controlled material removal by adjusting applied voltage and hydrogen plasma etching parameters.
Investigated the effect of processing on the mechanical properties of the diamond surface.

Main Results:

Achieved material removal over an area larger than the AFM tip size.
Demonstrated significant reduction in the hardness of the diamond material surrounding the removal zone.
Showcased the ability to scratch the modified diamond surface with a silicon tip.

Conclusions:

The developed AFM tip-based local anodic oxidation is an effective technique for controlled material removal on diamond.
This method significantly improves the machinability of diamond surfaces.
The findings pave the way for enhanced fabrication of diamond-based electronic and photonic devices.