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High Performance Broadband Polarization-Sensitive Photodetector Enabled by Mixed-Dimensional n-ReS2/p-GaAs van der
Bing Wang1, Zuocheng Pu2, Chaoyang Liu3
1Guangdong Provincial Key Laboratory of Chip and Integration Technology, School of Electronic Science and Engineering (School of Microelectronics), Faculty of Engineering, South China Normal University, Foshan 528200, P. R. China.
Abstract:
The realization of photodetectors capable of broadband detection, self-powered operation, and polarization sensitivity is crucial for advancing next-generation optoelectronic technologies. A mixed-dimensional van der Waals heterojunction photodetector composed of two-dimensional ReS2 and three-dimensional p-type GaAs was designed and fabricated in this study. The device effectively achieves broadband self-powered photodetection across the spectral range of 254-808 nm at zero external bias. When exposed to 365 nm ultraviolet radiation, the photodetector delivers a high responsivity of 0.15 A/W and a specific detectivity reaching 8.39 × 1011 Jones. Additionally, it demonstrates rapid temporal response, with rise and decay times of 77 and 81 ms, respectively. Benefiting from the intrinsic in-plane anisotropy of the ReS2 crystal lattice and the effective depletion region at the ReS2/GaAs interface, the device reveals pronounced polarization sensitivity, with the polarization ratios of 2.11 at Vds = 0 V and 14.46 at Vds = -1 V under 405 nm. These findings underscore the promising prospects of n-ReS2/p-GaAs heterostructures in enabling multifunctional, energy-efficient, and high-performance photodetection, with particular relevance to polarization-resolved imaging and next-generation optical sensing technologies.
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