Detecting grain-scale plastic deformation events with time-resolved far-field high-energy diffraction microscopy

Yuefeng Jin1, Wenxi Li1,2, Amlan Das3

  • 1Department of Mechanical Engineering, University of Michigan, Ann Arbor, Michigan, USA.

Journal of Applied Crystallography
|October 9, 2025
PubMed
Summary

Far-field high-energy diffraction microscopy (ff-HEDM) now validates methods for tracking grain-scale plastic deformation. This study cross-validates four ff-HEDM techniques, revealing distinct stress relaxation patterns and plastic event propagation.