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Influence of Hybrid Perovskite Fabrication Methods on Film Formation, Electronic Structure, and Solar Cell Performance
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Multidimensional Additive Manufacturing for Perovskite Optoelectronic Devices.

Kai Zhuang1, Hao Jiang1, Nuermuhanmode Naerkezha1

  • 1Smart Manufacturing Thrust, Systems Hub, The Hong Kong University of Science and Technology (Guangzhou), Guangzhou, 511458, P. R. China.

Advanced Materials (Deerfield Beach, Fla.)
|October 24, 2025
PubMed
Summary
This summary is machine-generated.

Additive manufacturing (AM) enables the fabrication of multidimensional halide perovskite optoelectronics, overcoming limitations of traditional methods. This review explores AM techniques for creating advanced perovskite structures for next-generation devices.

Keywords:
additive manufacturingmultidimensionaloptoelectronicsperovskites

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Area of Science:

  • Materials Science
  • Optoelectronics
  • Nanotechnology

Background:

  • Halide perovskite optoelectronics have advanced significantly, requiring dimensional control for diverse applications.
  • Conventional fabrication methods struggle with creating multi-dimensional perovskite structures.

Purpose of the Study:

  • To review additive manufacturing (AM) techniques for fabricating multidimensional perovskite optoelectronics.
  • To analyze AM methods for their resolution, scalability, and ink formulation strategies.

Main Methods:

  • Categorization of AM techniques: nozzle-based deposition, light-assisted processing, and mechanical transfer printing.
  • Analysis of printing resolution, dimensional scalability, and ink formulation for printability and crystallinity.

Main Results:

  • Additive manufacturing offers a versatile, cost-effective platform for perovskite fabrication.
  • AM techniques enable low-temperature, spatially controlled crystallization for diverse dimensionalities (0D to 4D).

Conclusions:

  • AM integration facilitates the development of next-generation optoelectronics with complex, multidimensional structures.
  • Understanding the interplay between ink rheology, energy-field parameters, and device performance is crucial for optimal AM method selection.