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First Demonstration of Hysteresis-Free IGZO/SnO-Based Complementary Circuits and SRAM with Long-Term Reliability
Changwoo Han1, Hyeonjung Park2, Yejoo Choi3
1School of Electrical Engineering, Korea University, Seoul, 02841, South Korea.
This study demonstrates low-voltage, hysteresis-free complementary circuits using indium gallium zinc oxide (IGZO) and tin monoxide (SnO) thin-film transistors (TFTs). These oxide semiconductor circuits offer potential for low-power, reliable system integration and future AI hardware.
Area of Science:
- Materials Science
- Electrical Engineering
- Semiconductor Physics
Background:
- Development of advanced semiconductor materials is crucial for next-generation electronics.
- Oxide semiconductors offer unique properties for low-power applications.
- Complementary circuits require both n-type and p-type transistors for efficient operation.
Purpose of the Study:
- To demonstrate complementary logic and memory circuits using n-type Indium Gallium Zinc Oxide (IGZO) and p-type Tin Monoxide (SnO) thin-film transistors (TFTs).
- To achieve low-voltage, hysteresis-free operation with enhanced stability and reduced device variation.
- To explore the potential of these circuits for low-power system integration and future electronic applications.
Main Methods:
- Fabrication of n-type IGZO and p-type SnO TFTs.
- Optimization of IGZO channel thickness to tune inverter switching points.
- Application of SU-8 passivation to suppress bias-stress-induced degradation.
- Characterization of device performance, including voltage gain, power consumption, and stability.
- Demonstration of a 3-stage ring oscillator and 6T-Static Random-Access Memory (SRAM) cells.
Main Results:
- Achieved low-voltage, hysteresis-free operation with high voltage gain (146.6 V/V) and ultra-low static power consumption (nanowatt range).
- SU-8 passivation effectively improved long-term stability and reduced device variation in both IGZO and SnO TFTs.
- Demonstrated stable oscillations in a 3-stage ring oscillator and tunable static noise margins in 6T-SRAM cells.
Conclusions:
- IGZO/SnO complementary circuits enable high-performance, low-power logic and memory functions.
- The demonstrated devices exhibit excellent stability and reliability, suitable for practical applications.
- This work highlights the significant potential of oxide semiconductor complementary circuits for future low-power electronics, non-volatile memory, and on-device AI hardware.
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