Enhanced X-ray structural analysis using total variation denoising of X-ray diffraction images

A denoising method based on total variation regularization was applied to X-ray diffraction images obtained from X-ray crystallography experiments. This approach significantly enhanced the signal-to-noise ratio of weak diffraction spots. Subsequently, the denoised images were used for crystal structure data processing using cytidine as a standard sample, which yielded an improved structural analysis result. This image processing technique offers a practical method for improving the quality of weak diffraction data, which is particularly relevant for challenging samples such as microcrystals, thereby enabling more reliable crystallographic analysis.