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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Updated: Jan 8, 2026

Fabrication and Testing of Microfluidic Optomechanical Oscillators

Fabrication and Testing of Microfluidic Optomechanical Oscillators

Published on: May 29, 2014

Single-Mode Ring Resonator-Based Optomechanical Transducers for Advanced Atomic Force Sensing.

Yide Zhang^1,2,3, Artem S Vorobev^2,3, Savda Sam^1,2,3

¹Institute of Chemical Technologies and Analytics, TU Wien, Vienna 1060, Austria.

|December 22, 2025

Summary

This summary is machine-generated.

We developed a novel single-mode ring resonator optomechanical transducer for Atomic Force Microscopy (AFM). This compact, silicon-on-insulator device offers enhanced mode stability and high-precision force sensing capabilities.

Keywords:

Atomic Force Microscopy (AFM)displacement densing force sensing optomechanical transducer ring resonator silicon photonics

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Area of Science:

Nanotechnology
Optomechanics
Materials Science

Background:

Atomic Force Microscopy (AFM) performance is limited by cantilever constraints.
Existing optomechanical transducers face challenges with mode stability and complex optical responses.

Purpose of the Study:

To develop a compact and efficient single-mode ring resonator-based optomechanical transducer.
To overcome limitations of conventional AFM transducers for enhanced performance.

Main Methods:

Utilized a silicon-on-insulator (SOI) platform for a single-mode ring resonator.
Integrated a picogram-scale cantilever with the optomechanical transducer.
Achieved tunable mechanical resonance frequency and adjustable stiffness.

Main Results:

Exceptional displacement resolution of 6.7 × 10^-16 m/Hz^1/2.
Force detection limit down to 5.0 × 10^-14 N.
Demonstrated strong agreement between experimental results and theoretical predictions.

Conclusions:

The single-mode optomechanical transducer provides a stable, high-sensitivity platform for AFM.
Offers a compact, scalable, and precise alternative to traditional optical detection methods.
Enables next-generation nanoscale sensing and AFM applications with tunable performance.