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Copper Intrauterine Device Migration Into Cesarean Scar Niches Without Complications: A Case Report
Zahra Salehi1, Roya Derakhshan1, Neda Hashemi1
1Endometriosis Research Center, Iran University of Medical Sciences, Tehran, Iran, iums.ac.ir.
Introduction:
Intrauterine devices (IUDs), both hormonal and nonhormonal, are widely used contraceptive methods, with approximately 20% of reproductive-aged women worldwide utilizing them. Although IUDs are generally considered safe and effective, complications such as displacement and migration can occur. We report a rare case of copper IUD migration into a cesarean section scar niche.
Case Presentation:
A 28-year-old woman presented to the emergency department with complaints of lower abdominal pain and abnormal vaginal bleeding. She had received a T-shaped copper IUD 2 years prior. Transvaginal ultrasound revealed an inverted IUD within the endometrial cavity, with one arm embedded in the cesarean scar defect. The device was successfully removed via hysteroscopy without complication.
Conclusion:
This case highlights the importance of imaging evaluation in symptomatic IUD users with a history of cesarean delivery.
