Analysis of low Z and medium Z elements using synchrotron based total reflection x-ray fluorescence at BL-16 beamline...

The determination of low-Z elements (Z < 17), such as Na, Mg, Al, Si, S, and P, in trace amounts is crucial in various fields ranging from semiconductors to biological sciences. Similarly, the detection of medium-Z elements, such as Mo, Ru, Pd, Ag, Cd, and Sn, is vital for the pharmaceutical industry and other energy-sector-related applications. Synchrotron-based total reflection X-ray fluorescence (TXRF) is a well-known analytical technique for the detection of elements at trace and ultratrace levels. We present here the commissioning results of a newly developed, vacuum-compatible TXRF system designed for the detection of low-Z and medium-Z elements at the microprobe X-ray fluorescence beamline (BL-16) of the Indus-2 synchrotron facility. The achieved detection limits for Na, Mg, Al, Si, P, and S at an excitation X-ray energy of 6 keV were found to be in the range of ∼2 μg to 15 ng. However, in the case of medium-Z elements, analyzed using their Lα peaks, the detection limits were found to be in the range of ∼19 ng (Mo) to 5 ng (Sn). Relative sensitivity (Sj) with respect to Sc was also determined and further validated by analyzing an ICP multi-element standard IV. To employ it for a real application, the concentration of various low-Z elements present in coconut water was determined. The results obtained demonstrate that the newly commissioned TXRF setup has relatively enhanced elemental detection capabilities at the BL-16 beamline, enabling reliable analysis of both low-Z and medium-Z elements along with other elements.