X-ray Crystallography
Leaky Scanning
X-ray Imaging
Heating and Cooling Curves
Acid-Base Titration Curves
Curve Equations
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Updated: Jan 28, 2026

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
Published on: September 28, 2016
Hirokatsu Yumoto1,2, Takahisa Koyama1,2, Haruhiko Ohashi1,2
1Japan Synchrotron Radiation Research Institute, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198, Japan.
A new non-contact scanning profilometer, the Zero-method Scanning-probe Profilometer (ZSP), achieves 1.3 nm reproducibility for precise x-ray optics metrology. This advancement is crucial for developing next-generation synchrotron radiation and x-ray free-electron laser facilities.
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