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Design of a Bandgap Reference with a High PSRR and Strong Load-Driving Capability.

Meng Li1, Lei Guo1, Bin Liu1

  • 1School of information Science and Engineering, Shenyang University of Technology, Shenyang 110870, China.

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Summary

This study presents an improved bandgap reference (BGR) circuit with enhanced stability and load-driving capacity. The novel design minimizes temperature drift and improves power supply rejection for reliable voltage references.

Keywords:
bandgap referencehigh PSRRhigh load-driving capabilitylow temperature coefficient

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Area of Science:

  • Electrical Engineering
  • Analog Integrated Circuit Design
  • Semiconductor Devices

Background:

  • Traditional bandgap reference (BGR) circuits suffer from temperature drift, poor power-supply rejection, and limited load-driving capability.
  • Intrinsic offset voltage in BGRs, caused by structural mismatches, degrades reference voltage stability.
  • Existing designs often fail to maintain stable output under dynamic load conditions.

Purpose of the Study:

  • To introduce an enhanced bandgap reference (BGR) design that overcomes the limitations of conventional circuits.
  • To improve the temperature stability, power-supply rejection ratio (PSRR), and load-driving capacity of BGR circuits.
  • To achieve a stable 2.5 V reference voltage with minimal temperature coefficient and excellent load tolerance.

Main Methods:

  • Implemented a symmetric folded common-emitter-common-base bipolar junction transistor (BJT) amplifier with MOS-assisted biasing.
  • Enforced branch voltage symmetry to suppress intrinsic offset voltage caused by structural mismatch.
  • Integrated a negative-feedback adaptive current-adjustment driver for dynamic output current regulation.

Main Results:

  • The proposed BGR design achieved a stable 2.5 V output voltage from a 3.3 V supply.
  • Demonstrated a low temperature coefficient (TC) of 2.372×10-6 °C-1.
  • Simulated PSRR values of -114.2 dB at DC and -62.07 dB at 1 kHz.
  • Exhibited excellent load tolerance, maintaining stable 2.5 V output with load capacitance ranging from 0.1 μF to 100 μF.

Conclusions:

  • The enhanced BGR design effectively suppresses intrinsic offset, leading to improved reference voltage stability.
  • The integrated adaptive current driver significantly enhances load-driving capability and output stability under varying loads.
  • The proposed circuit offers a superior alternative for applications requiring stable voltage references with high precision and reliability.