Raman Spectroscopy: Overview
Second Order systems II
Self-Evaluation: Self-Enhancement and Self-Verification
Raman Spectroscopy Instrumentation: Overview
First Order Systems
Second Order systems I
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Krystof Brezina1, Yair Litman2,3, Mariana Rossi1,3
1Max Planck Institute for the Structure and Dynamics of Matter, Luruper Chaussee 149, 22761 Hamburg, Germany.
View abstract on PubMed
Simulations of tip-enhanced Raman spectroscopy (TERS) must include substrate effects. Ignoring metallic surfaces alters TERS images, impacting vibrational mode analysis and chemical characterization of surface-bound systems.
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