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Updated: Feb 15, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
Highly reflective Cr/C-based multilayer X-ray mirrors for the wavelength λ = 4.47 nm
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The structural and reflective characteristics of multilayer X-ray mirrors based on Cr/C, optimized for the spectral range of the "carbon transparency window" wavelengths of 4.4-6.6 nm, were investigated. It is shown that interlayer interfaces at the Cr-on-C boundary are more extended than those at the C-on-Cr boundary. Passivation of carbon layers with nitrogen enables a significant reduction in the size of the interlayer interfaces at the Cr-to-C boundary from 0.51 nm to 0.39 nm. The use of the specified interface engineering technique has made it possible to obtain a record value for the reflection coefficient of a Cr/C normal incidence multilayer mirror R = 20.2% at a wavelength of λ = 4.47 nm.
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