Approach and setup to measure high thermal conductivity in multigraphene materials

The approach and the setup for high thermal conductivity material λ > 300 W × m-1 × K-1 measurement were developed. The method is based on the measurement of established temperature gradients and thermal flows, followed by hardware and software processing. The setup was tested on copper, aluminum, isotropic graphite, and multigraphene materials with different thermal conductivities. Heat distribution and loss computer modeling was done to improve the measurement accuracy. Raw experimental data of multigraphene material with λ ∼ 500 W × m-1 × K-1 thermal conductivity were established to be 2% overestimated due to heat losses. The designed device is shown to provide high thermal conductivity and reliable measurements, complementing the instrumental capabilities of the laser flash assay and HotDisc.