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Subsurface Defect Localization by Structured Heating Using Laser Projected Photothermal Thermography
Published on: May 15, 2017
Chao Gao1, Xin Zhang1, Mengting Bai1
1School of Computer and Artificial Intelligence, Beijing Technology and Business University, Beijing 102488, China.
A new Ghost-BiFPN-Efficient-YOLOv8 (GBE-YOLOv8) model enhances printed circuit board (PCB) defect detection. This AI approach improves accuracy and efficiency for real-time surface inspection in manufacturing.
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