RAPIDviewer: an ImageJ script for visualization and analysis of indexed electron diffraction patterns of cubic

Thomas E Weirich1

  • 1Gemeinschaftslabor für Elektronenmikroskopie (GFE) RWTH Aachen University Ahornstrasse 55 52074Aachen Germany.

Journal of Applied Crystallography
|April 10, 2026
PubMed
Summary

RAPIDviewer enhances electron diffraction pattern analysis by generating graphical overlays and export options. This ImageJ macro improves indexing accuracy for cubic materials, aiding materials science research.