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Total-reflection-based microscope compatible with X-ray and visible light for sample positioning
Kyota Yoshinaga1, Jordan Tyler O'Neal2, Kai Sakurai2
1RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198, Japan.
Journal of Synchrotron Radiation
|April 14, 2026
Summary
This study introduces a novel microscope that uses a Wolter mirror for both X-ray and visible light, simplifying sample positioning in X-ray imaging and reducing radiation damage to samples.
Area of Science:
- Optics
- X-ray Microscopy
- Biophysics
Background:
- Sample positioning in X-ray imaging is challenging and can damage samples.
- Visible-light microscopes aid positioning but require complex calibration with X-ray systems.
Purpose of the Study:
- To develop a simpler, damage-free sample positioning method for X-ray microscopy.
- To create a microscope compatible with both visible light and X-rays.
Main Methods:
- A total-reflection-based microscope using a Wolter mirror was designed.
- The Wolter mirror served as both X-ray condenser and visible-light objective.
- Calibration involved simple adjustments of a lens and mirrors, not the objective optic.
Main Results:
- A functional system was built for soft X-ray ptychography.
- Simple visible-light microscope calibration was successfully demonstrated.
- Biological samples were positioned without radiation dose.
Conclusions:
- The proposed Wolter mirror microscope simplifies calibration and sample positioning.
- This method enables damage-free positioning for X-ray imaging applications.
- The system is suitable for biological sample analysis using soft X-ray ptychography.
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