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Total-reflection-based microscope compatible with X-ray and visible light for sample positioning.

Kyota Yoshinaga1, Jordan Tyler O'Neal2, Kai Sakurai2

  • 1RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198, Japan.

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Summary
This summary is machine-generated.

This study introduces a novel microscope that uses a Wolter mirror for both X-ray and visible light, simplifying sample positioning in X-ray imaging and reducing radiation damage to samples.

Keywords:
Wolter mirrorbiological specimensample positioningsoft X-ray microscopevisible light

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Area of Science:

  • Optics
  • X-ray Microscopy
  • Biophysics

Background:

  • Sample positioning in X-ray imaging is challenging and can damage samples.
  • Visible-light microscopes aid positioning but require complex calibration with X-ray systems.

Purpose of the Study:

  • To develop a simpler, damage-free sample positioning method for X-ray microscopy.
  • To create a microscope compatible with both visible light and X-rays.

Main Methods:

  • A total-reflection-based microscope using a Wolter mirror was designed.
  • The Wolter mirror served as both X-ray condenser and visible-light objective.
  • Calibration involved simple adjustments of a lens and mirrors, not the objective optic.

Main Results:

  • A functional system was built for soft X-ray ptychography.
  • Simple visible-light microscope calibration was successfully demonstrated.
  • Biological samples were positioned without radiation dose.

Conclusions:

  • The proposed Wolter mirror microscope simplifies calibration and sample positioning.
  • This method enables damage-free positioning for X-ray imaging applications.
  • The system is suitable for biological sample analysis using soft X-ray ptychography.