Microstructural Characterization of Defects and Secondary Phases in (Ti, Ta)C-Type Carbides in Nickel-Based

Xin Jin1, Yunsong Zhao2, Wei Chen1

  • 1State Key Laboratory of Opto-Electronic Information Acquisition and Protection Technology, Leibniz International Joint Research Center of Materials Sciences of Anhui Province, Institutes of Physical Science and Information Technology, Anhui University, Hefei 230601, China.