FMW-YOLO: A Frequency-Enhanced and Multi-Scale Context-Aware Framework for PCB Defect Detection

A high-precision and efficient surface defect detection for printed circuit board (PCB) is critical to ensuring the reliability of electronic systems. However, the presence of complex circuit backgrounds and the small scale of defects often limit the precision and effectiveness of conventional inspection approaches. To address these challenges, this paper proposes FMW-YOLO, a lightweight and accurate detection framework based on YOLO11n. Specifically, a Frequency-Enhanced Channel-Transposed and Local Feature backbone network is developed to improve feature extraction. By designing a Dual-Frequency and Channel Attention Aggregation module and a Lightweight Edge-Gaussian Block, the original C3k2 structure is refined to suppress noise interference while preserving high-frequency details, thereby enhancing feature representation. Furthermore, a neck network incorporating a Multi-Scale Context-Aware Enhancement mechanism is constructed, in which an Attention-Integrated Feature Pyramid is employed to facilitate more effective cross-scale feature interaction. In addition, a Dilated Reparam Residual Module is embedded into the C3k2 structure to expand the receptive field without significantly increasing computational burden. Finally, Wise-IoU is adopted to optimize bounding box regression by assigning greater importance to anchors of moderate quality. Extensive experiments conducted on the HRIPCB and DeepPCB datasets demonstrate that FMW-YOLO improves mAP50 by 2.1% and 0.3%, respectively, while reducing the number of parameters by 23%. These results indicate that the proposed method achieves improved detection accuracy and demonstrates strong potential for practical industrial applications.