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Related Concept Videos

Imaging Biological Samples with Optical Microscopy01:18

Imaging Biological Samples with Optical Microscopy

Optical microscopy uses optic principles to provide detailed images of samples. Antonie van Leeuwenhoek designed the first compound optical microscope in the 17th century to visualize blood cells, bacteria, and yeast cells. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes with enhanced magnification and resolution.
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Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
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Updated: Jun 11, 2026

High-Throughput Total Internal Reflection Fluorescence and Direct Stochastic Optical Reconstruction Microscopy Using a Photonic Chip
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Published on: November 16, 2019

Optically modulated free-electron computational ghost imaging for long-working-distance surface characterization.

Zhe Yu1, Jian Wang1, Shuming Yang2

  • 1School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan 430074, China.

Ultramicroscopy
|June 9, 2026
PubMed
Summary
This summary is machine-generated.

We developed a new imaging method using structured electron beams to overcome resolution limits in scanning electron microscopy (SEM). This technique achieves high-fidelity surface characterization even with low electron flux and long working distances.

Keywords:
Aberration effectsComputational ghost imagingLow-flux imagingOptically modulated electron beamsSurface characterization

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Area of Science:

  • Physics
  • Materials Science
  • Imaging Technology

Background:

  • Scanning electron microscopy (SEM) faces inherent resolution limits due to aberrations.
  • Ultrafast electron microscopy (UEM) is further constrained by long working distances and low electron flux.
  • These limitations hinder high-resolution surface characterization in advanced microscopy.

Purpose of the Study:

  • To overcome the resolution-aberration trade-off in SEM and UEM.
  • To enable high-fidelity surface characterization under challenging imaging conditions.
  • To introduce a novel computational ghost imaging framework for electron microscopy.

Main Methods:

  • Developed an optically modulated free-electron computational ghost imaging framework.
  • Utilized laser-induced ponderomotive modulation for structured electron illumination.
  • Integrated spherical aberration into the forward model for aberration resilience.
  • Employed a modified stochastic gradient descent algorithm for image reconstruction.

Main Results:

  • Demonstrated high-fidelity surface characterization via numerical simulations.
  • Achieved robust imaging under long-working-distance and low-flux conditions.
  • Showcased superior performance compared to conventional SEM where signal is limited.

Conclusions:

  • The proposed framework overcomes fundamental constraints in electron microscopy.
  • This aberration-resilient imaging paradigm is suitable for signal-starved and aberration-dominated platforms.
  • Offers a robust pathway for high-resolution imaging in advanced electron microscopy applications.