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Characterization of topographic lateral resolution in coherence scanning interferometry based on a virtual instrument
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Coherence scanning interferometry (CSI) is widely used to measure surface microstructures and roughness. In such applications, characterizing the instrument's topographic lateral resolution is essential for assessing the fidelity and limitations of measured topography. Using prior knowledge of the instrument's three-dimensional transfer function, this study presents a virtual-instrument-based approach for evaluating the spatial frequency response (SFR) of CSI, which enables quantitative characterization of its topographic lateral resolution. The instrument's three-dimensional transfer function is obtained from a standard microsphere measurement and used to construct a virtual CSI for SFR calibration. The method is applied to a commercial CSI system under different defocus conditions to evaluate the influence of defocus on the SFR characteristics. Two reference sinusoidal gratings are then measured to show close agreement between the virtual-instrument-based SFR calibration and the measured height responses.
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