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Industrial Weld Defect Detection Based on Monocular Depth Estimation and Dual-Attention Point Cloud Network.
1School of Computer Science and Engineering, Guangdong Ocean University, Yangjiang 529568, China.
Sensors (Basel, Switzerland)
|June 12, 2026
Summary
This study introduces a low-cost framework for detecting weld defects using monocular depth estimation and a dual-attention point cloud network. The method achieves high accuracy and recall, offering a cost-effective solution for industrial automation.
Area of Science:
- Industrial Quality Control
- Computer Vision
- Machine Learning
Background:
- Traditional 2D methods for weld defect detection suffer from illumination and texture interference.
- High-precision 3D laser scanning is expensive and impractical for large-scale industrial use.
- Accurate geometric defect identification is crucial for industrial quality control.
Purpose of the Study:
- To develop a cost-effective framework for reliable geometric weld defect detection.
- To address challenges in identifying complex missed weld defects with distinct spatial features.
- To enhance feature representation in point cloud networks for improved classification.
Main Methods:
- Utilized YOLOv8 for rapid region of interest extraction.
- Employed advanced monocular depth estimation to generate 3D pseudo-point clouds.
- Introduced a dual-attention enhanced point cloud classification network (DA-PointNet++) integrating dual-attention modules into PointNet++.
Main Results:
- Achieved 93.67% accuracy and 90.51% recall in a unified binary classification task.
- Effectively identified both normal welds and complex missed weld defects.
- Demonstrated significant reduction in false negative rates compared to PointConv, DGCNN, and Point Cloud Transformer.
Conclusions:
- The proposed framework offers a cost-effective solution for industrial automation in weld defect detection.
- DA-PointNet++ enhances feature representation for improved geometric defect identification.
- The approach provides reliable and low-cost geometric defect detection, overcoming limitations of existing methods.
