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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

Aliasing

Aliasing

Accurate signal sampling and reconstruction are crucial in various signal-processing applications. A time-domain signal's spectrum can be revealed using its Fourier transform. When this signal is sampled at a specific frequency, it results in multiple scaled replicas of the original spectrum in the frequency domain. The spacing of these replicas is determined by the sampling frequency.
If the sampling frequency is below the Nyquist rate, these replicas overlap, preventing the original signal...

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Updated: Jun 17, 2026

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

Sub-Nyquist sampling based amplitude demodulation for resonant-mode atomic force microscopy.

Peng Li¹, Jinhao Liu¹, Xiucheng Liu¹

¹School of Information Science and Technology, Beijing University of Technology, Beijing 100124, China.

The Review of Scientific Instruments

|June 16, 2026

Summary

This summary is machine-generated.

A new sub-Nyquist sampling method accurately demodulates atomic force microscopy (AFM) cantilever amplitude at lower rates. This reduces hardware demands, enabling cost-effective, real-time data processing for resonant-mode AFM applications.

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Area of Science:

Physics
Materials Science
Engineering

Background:

Resonant modes in atomic force microscopy (AFM), like tapping mode, utilize cantilever oscillations at high resonance frequencies (hundreds of kHz).
Conventional amplitude demodulation in AFM relies on lock-in amplifiers, which necessitate high-speed analog-to-digital converters (ADCs) for signal acquisition.
These high-speed ADCs create significant demands on data acquisition and real-time processing hardware, increasing system complexity and cost.

Purpose of the Study:

To develop a novel amplitude demodulation method for resonant-mode AFM that overcomes the limitations of conventional high-speed sampling.
To enable accurate cantilever amplitude demodulation using sub-Nyquist sampling principles.
To reduce hardware requirements and computational load for real-time AFM data processing.

Main Methods:

A sub-Nyquist sampling-based amplitude demodulation technique is proposed for resonant-mode AFM.
This method exploits the characteristic that cantilever amplitude variations in AFM typically contain bandwidths much lower than the carrier vibration frequency.
The technique achieves accurate demodulation at sampling rates substantially below the Nyquist rate of the vibration signal.

Main Results:

The sub-Nyquist sampling method successfully demodulates cantilever amplitude accurately, despite using a significantly reduced sampling rate.
Real-time amplitude demodulation is achieved without requiring high-speed ADCs or complex processing hardware.
Force-distance curve measurements and imaging experiments demonstrate performance comparable to conventional lock-in amplifier methods.

Conclusions:

The proposed sub-Nyquist sampling method offers a practical and cost-effective solution for simplifying hardware in resonant-mode AFM systems.
It effectively addresses the challenge of high-frequency signal acquisition and processing in AFM.
This approach facilitates more accessible and efficient AFM instrumentation.