Related Experiment Video
Updated: Jun 18, 2026

Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope
Published on: September 14, 2018
Microtron electron beam enables post-synthetic defect engineering in ultrasmall ceria nanocrystals
Zuzana Šiška1,2, Tereza Sojková1, Martin Sojka1
1Institute of Physics of Materials and CEITEC IPM, Czech Academy of Sciences Žižkova 513/22 616 00 Brno Czech Republic sojkova@ipm.cz.
None:
This work explores high-dose MeV beam irradiation as a dopant-free, post-synthetic route to tune defect-related properties in 2-3 nm colloidal CeO2 nanoparticles. Oleate/oleylamine-stabilised nanoceria were reproducibly prepared via degassing-controlled thermal decomposition in dibenzyl ether. After that, the CeO2 nanoparticles were irradiated with a 16.5 MeV beam for 10, 40, and 80 min with nominal absorbed doses up to 171 ± 51 MGy while retaining crystalline fluorite cores. XPS and TEM-EELS analyses indicate the presence of irradiation-induced Ce3+/oxygen vacancy states, although spectral limitations prevent robust quantitative ranking of Ce3+. Surface-sensitive readouts show a non-monotonic response: the apparent optical bandgap narrows at the intermediate dose and partially recovers at the highest dose, accompanied by corresponding changes in the Urbach tail. In contrast, room-temperature magnetisation is substantially enhanced relative to pristine nanoceria and changes only weakly between the two highest-dose conditions. These observations suggest that defect centres persist within the nanoparticle volume even when the near-surface microstructure changes.
More Related Videos
07:20Fabrication of Micro-Patterned Chip with Controlled Thickness for High-Throughput Cryogenic Electron Microscopy
Published on: April 21, 2022
07:24Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
Published on: May 10, 2021