Multi-Parameter Wavelength Characterization of Array Spectrometers Under Near-Limit Sampling Conditions.

Du Bo1, Liu Liying2,3, Wu Dongli1

  • 1Meteorological Observation Centre of China Meteorological Administration, Beijing, 100081, China.

Summary

Accurate wavelength characterization is crucial for spectral measurements. This study reveals sampling conditions significantly impact wavelength definitions and resolution metrics in array spectrometers, necessitating a coupled approach for precise calibration.

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