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Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
Jianchuan Wei1, Zhanying Peng1, Xiaoming Chen1
1School of Information and Communications Engineering, Xi'an Jiaotong University, Xi'an 710049, China.
A new method enables flexible over-the-air (OTA) testing by overcoming limitations of traditional methods. This spatial-spectral composite operator improves accuracy and stability for eccentric device testing in anechoic chambers.
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