Microstructure-Driven Loss Mechanisms and Tensor-Based FEM Calibration

Annamaria Muoio1, Angela Garofalo2, Francesco La Via1

  • 1Institute for Microelectronics and Microsystems(IMM), National Research Council (CNR), Strada VIII, 5, 95121 Catania, Italy.

Micromachines
|July 28, 2026
PubMed
Summary

This study reveals anisotropic damping in silicon carbide (SiC) resonators is crucial for MEMS. An advanced tensor model accurately predicts Q-factors, outperforming isotropic methods for next-gen devices.