Ethanol-Enhanced Etch rate in alpha irradiated CR-39 detectors

CR-39 solid state nuclear track detectors (SSNTDs) are extensively used for alpha particle detection and neutron dosimetry. However, their relatively long chemical etching time in conventional NaOH solutions limits their efficiency in routine applications. This study aims to venture into faster etching solutions of CR-39 detectors, so as to facilitate their use in routine measurements. Unexposed and alpha-particle-exposed CR-39 detectors were etched in 6.25 M NaOH containing different concentrations of ethanol (5% and 7%). Effect of ethanol addition in NaOH etchant resulted in increased bulk etch rate and reduced track development time. However ethanol addition also enhanced a relatively quicker track overlapping time. Alpha exposed CR-39 etching was thus standardised with the track-density stability zone obtained using ethanol added NaOH etchants, for quick etching.